Replication Data for: Elucidating the genetics of grain yield and stress-resilience in bread wheat using a large-scale genome-wide association mapping study with 55,568 lines

A large-scale genome-wide association study was carried out to dissect the genetic architecture of wheat grain yield potential and stress-resilience. Based on the findings, grain yield-associated marker profiles were generated for a large panel of 73,142 wheat lines and the grain-yield favorable allele frequencies were also determined. The marker profile data are presented in this dataset.